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Role Of Sio At Tco/P Interface On The Electrical-Properties Of The P/I Junction

AuthID
P-008-T0N

Author(s)

CARVALHO, C

DENIJS, JMM

MARTINS, R

GUIMARAES, L

Editor(s)

MADAN, A; HAMAKAWA, Y; THOMPSON, MJ; TAYLOR, PC; LECOMBER, PG

Document Type

Proceedings Paper

Year published

1991

Published

in AMORPHOUS SILICON TECHNOLOGY - 1991 in MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS

Volume: 219, Pages: 487-492 (6)

Conference

Symp At The 1991 Spring Meeting Of The Materials Research Soc : Amorphous Silicon Technology, Date: APR 30-MAY 01, 1991, Location: ANAHEIM, CA, Sponsors: MAT RES SOC

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Publication Identifiers

DOI: 10.1557/proc-219-487

Wos: WOS:A1991BU93V00074

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Role Of Sio At Tco/P Interface On The Electrical-Properties Of The P/I Junction

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