in POLARIZATION: MEASUREMENT, ANALYSIS, AND REMOTE SENSING II in PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE), ISSN: 0277-786X
Volume: 3754, Pages: 402-410 (9)
Conference
Conference on Polarization - Measurement, Analysis, and Remote Sensing Ii, Date: JUL 19-21, 1999, Location: DENVER, CO, Sponsors: SPIE