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Non Invasive Electrical Characterization of Semiconductor and Interface
AuthID
P-008-XMK
6
Author(s)
Kasouit, S
·
Drevillon, B
·
Conde, J
·
Kim, HJ
·
Kleider, JP
·
Vanderhaghen, R
1
Editor(s)
Brown G.J.Razeghi M.
Document Type
Proceedings Paper
Year published
2002
Published
in
Proceedings of SPIE - The International Society for Optical Engineering,
ISSN: 0277-786X
Volume: 4650, Pages: 213-220
Conference
Photodetector Materials and Devices Vii,
Date:
21 January 2002 through 23 January 2002,
Location:
San Jose, CA,
Sponsors:
SPIE
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Metadata
Sources
Publication Identifiers
DOI
:
10.1117/12.467666
Scopus
: 2-s2.0-0036060513
Source Identifiers
ISSN
: 0277-786X
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