Entropy-Based Test Generation for Improved Fault Localization

AuthID
 P-008-YED
4
Author(s)
Fraser, G
·
d'Amorim, M
3
Editor(s)
Ewen Denney; Tevfik Bultan; Andreas Zeller
Document Type
Proceedings Paper
Year published
2013
Published
in 2013 28TH IEEE/ACM INTERNATIONAL CONFERENCE ON AUTOMATED SOFTWARE ENGINEERING (ASE) in IEEE ACM International Conference on Automated Software Engineering, ISSN: 1527-1366
Pages: 257-267 (11)
Conference
28Th Ieee/Acm International Conference on Automated Software Engineering (Ase), Date: NOV 11-15, 2013, Location: Palo Alto, CA, Sponsors: IEEE, Assoc Comp Machinery, IEEE Comp Soc, Tech Council Software Engn, Special Interest Grp Software Engn, Assoc Comp Machinery, SIGART, NASA, Stinger Ghaffarian Technologies, Google, Microsoft, D Risq Software Syst
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Wos®
Scopus®
Dblp®/en/publications/view/293325
Crossref®32
Google Scholar®
Publication Identifiers
DBLP: conf/kbse/CamposAFd13
SCOPUS: 2-s2.0-84893528180
Wos: WOS:000331090200027
Source Identifiers
ISSN: 1527-1366
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