Publications

A Study of the Internal and External Effects of Concurrency Bugs

AuthID
P-009-5XQ

Author(s)

Fonseca, P

Li, C

Singhal, V

Rodrigues, R

Document Type

Proceedings Paper

Year published

2010

Published

in Proceedings of the International Conference on Dependable Systems and Networks in DSN

Pages: 221-230

Conference

2010 Ieee/Ifip International Conference on Dependable Systems and Networks, Dsn 2010, Date: 28 June 2010 through 1 July 2010, Location: Chicago, IL, Sponsors: IEEE Comput. Soc. Tech. Comm. Dependable Comput. Fault Tolerance;IFIP Work. Group 10.4 Dependable Comput. Fault Tolerance

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