Influence of Lateral and In- Depth Metal Segregation on the Patterning of Ohmic Contacts for Gan-Based Devices

AuthID
 P-009-9VX
8
Author(s)
Vazquez, L
·
Romero, MF
·
Pantellini, A
·
Lanzieri, C
·
Munoz, E
Document Type
Article
Year published
2014
Published
in JOURNAL OF PHYSICS D-APPLIED PHYSICS, ISSN: 0022-3727
Volume: 47, Issue: 18
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Publication Identifiers
Scopus: 2-s2.0-84898940365
Wos: WOS:000334670600008
Source Identifiers
ISSN: 0022-3727
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