Publications

Efficient Analysis of Variability Impact on Interconnect Lines and Resistor Networks

AuthID
P-009-CVH

Author(s)

Villena, JF

Miguel Silveira, LM

Document Type

Proceedings Paper

Year published

2014

Published

in 2014 DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION (DATE) in Design Automation and Test in Europe Conference and Expo, ISSN: 1530-1591

Conference

Design, Automation and Test in Europe Conference and Exhibition (Date), Date: MAR 24-28, 2014, Location: Dresden, GERMANY, Sponsors: European Design & Automat Assoc, EDA Consortium, IEEE Council Elect Design Automat, ECSI, ACM Special Interest Grp Design Automat, Russian Acad Sci, IEEE Comp Soc Test Technol Tech Council, IEEE Solid State Circuits Soc, Int Federat Informat Proc

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