Electromigration-Aware and Ir-Drop Avoidance Routing in Analog Multiport Terminal Structures

AuthID
P-009-CZ9
4
Author(s)
Document Type
Proceedings Paper
Year published
2014
Published
in 2014 DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION (DATE) in Design Automation and Test in Europe Conference and Expo, ISSN: 1530-1591
Conference
Design, Automation and Test in Europe Conference and Exhibition (Date), Date: MAR 24-28, 2014, Location: Dresden, GERMANY, Sponsors: European Design & Automat Assoc, EDA Consortium, IEEE Council Elect Design Automat, ECSI, ACM Special Interest Grp Design Automat, Russian Acad Sci, IEEE Comp Soc Test Technol Tech Council, IEEE Solid State Circuits Soc, Int Federat Informat Proc
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Publication Identifiers
SCOPUS: 2-s2.0-84903837267
Wos: WOS:000354965500010
Source Identifiers
ISSN: 1530-1591
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