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Tunneling Escape Time from a Semiconductor Quantum Well in an Electric Field
AuthID
P-009-F16
3
Author(s)
Larkin, IA
·
Ujevic, S
·
Avrutin, EA
Document Type
Article
Year published
2009
Published
in
JOURNAL OF APPLIED PHYSICS,
ISSN: 0021-8979
Volume: 106, Issue: 11, Pages: 113701 (7)
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Publication Identifiers
DOI
:
10.1063/1.3259414
SCOPUS
: 2-s2.0-72449200652
Wos
: WOS:000272838600055
Source Identifiers
ISSN
: 0021-8979
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