Rfid Chip Characterization Through S-Parameter Measurements and Gene Expression Programming

AuthID
 P-009-RJ1
4
Author(s)
Document Type
Proceedings Paper
Year published
2014
Published
in 2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS, ISSN: 1091-5281
Pages: 207-211 (5)
Conference
Ieee International Instrumentation and Measurement Technology Conference (I2Mtc), Date: MAY 12-15, 2014, Location: Montevideo, URUGUAY, Sponsors: IEEE, IEEE Instrumentat & Measurement Soc
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Scopus®
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Publication Identifiers
Scopus: 2-s2.0-84905675091
Wos: WOS:000346477200041
Source Identifiers
ISSN: 1091-5281
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