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Multi-Dimensional Modelling of Electrostatic Forces Between Atomic Force Microscopy Tip and Dielectric Surface

AuthID
P-009-V9X

Author(s)

Boularas, A

Baudoin, F

Teyssedre, G

Villeneuve Faure, C

Clain, S

Document Type

Proceedings Paper

Year published

2013

Published

in Proceedings of IEEE International Conference on Solid Dielectrics, ICSD, ISSN: 1553-5282

Pages: 1040-1043

Conference

Icsd 2013 - Proceedings of the 2013 Ieee International Conference on Solid Dielectrics, Date: 30 June 2013 through 4 July 2013, Location: Bologna, Sponsors: IEEE;DEIS;Dow Inside;TECHMP

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Publication Identifiers

DOI: 10.1109/icsd.2013.6619876

Scopus: 2-s2.0-84891611910

Source Identifiers

ISSN: 1553-5282

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Multi-Dimensional Modelling of Electrostatic Forces Between Atomic Force Microscopy Tip and Dielectric Surface

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