Embedded Measurement System for Non-Destructive Testing Using New Eddy Currents Planar Array Probe

AuthID
 P-00A-3WM
4
Author(s)
Abrantes, R
·
Rosado, LS
·
Document Type
Proceedings Paper
Year published
2014
Published
in 2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS, ISSN: 10915281
Pages: 583-588 (6)
Conference
Ieee International Instrumentation and Measurement Technology Conference (I2Mtc), Date: MAY 12-15, 2014, Location: Montevideo, URUGUAY, Sponsors: IEEE, IEEE Instrumentat & Measurement Soc
Indexing
Wos®
Scopus®
Crossref®4
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-84905683936
Wos: WOS:000346477200113
Source Identifiers
ISSN: 10915281
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service