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Xafs and Xps Analysis of Zn0.98Fe0.02Te0.91Se0.09 Semiconductor
AuthID
P-00A-599
8
Author(s)
Radisavljevic, I
·
Trigueiro, J
·
Bundaleski, N
·
Medic, M
·
Romcevic, N
·
Teodoro, OMND
·
Mitric, M
·
Ivanovic, N
Document Type
Article
Year published
2015
Published
in
JOURNAL OF ALLOYS AND COMPOUNDS,
ISSN: 0925-8388
Volume: 632, Pages: 17-22 (6)
Indexing
Wos
®
Scopus
®
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1016/j.jallcom.2015.01.169
Scopus
: 2-s2.0-84922375565
Wos
: WOS:000350388900003
Source Identifiers
ISSN
: 0925-8388
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