Tem and Hrtem Characterization of Tial Diffusion Bonds Using Ni/Al Nanolayers

AuthID
 P-00A-ANH
5
Author(s)
Document Type
Article
Year published
2015
Published
in MICROSCOPY AND MICROANALYSIS, ISSN: 1431-9276
Volume: 21, Issue: 1, Pages: 132-139 (8)
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Scopus®
Crossref®13
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-84925248499
Wos: WOS:000351763500013
Source Identifiers
ISSN: 1431-9276
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