Special Issues and Methods for Testing Lnas at High Frequencies

AuthID
 P-00F-J2C
4
Author(s)
Carnlo, JP
·
Document Type
Proceedings Paper
Year published
2009
Published
in Proceedings of the DTIS'09 - 2009 4th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era
Pages: 277-280
Conference
2009 4Th Ieee International Conference on Design and Technology of Integrated Systems in Nanoscale Era, Dtis'09, Date: 6 April 2009 through 7 April 2009, Location: Cairo, Sponsors: IEEE Circuits and Systems Society;IEEE Egypt Section
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Publication Identifiers
Scopus: 2-s2.0-67650357932
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