Aluminium Incorporation in Alxga1-Xn/Gan Heterostructures: A Comparative Study by Ion Beam Analysis and X-Ray Diffraction

AuthID
 P-00F-KEZ
7
Author(s)
Gago, R
·
Gonzalez Posada, F
·
Kreissig, U
·
Brana, AF
·
Munoz, E
Document Type
Article
Year published
2008
Published
in THIN SOLID FILMS, ISSN: 0040-6090
Volume: 516, Issue: 23, Pages: 8447-8452 (6)
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Publication Identifiers
Wos: WOS:000260579800037
Source Identifiers
ISSN: 0040-6090
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