Self-Cleaning Effect and Compensation Mechanism in Cl-Doped High Resistivity Cadmium Telluride

AuthID
P-00F-P4M
6
Author(s)
Benz, K
·
Feltgen, T
·
Fiederle, M
·
Dieguez, E
4
Editor(s)
Goodnick, SM; Kailey, WF; Longshore, RE; Zhang, YH
Document Type
Proceedings Paper
Year published
1999
Published
in MATERIALS AND ELECTRONICS FOR HIGH-SPEED AND INFRARED DETECTORS in PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE), ISSN: 0277-786X
Volume: 3794, Pages: 88-95 (8)
Conference
Conference on Materials and Electronics for High-Speed and Infrared Detectors, Date: JUL 19-23, 1999, Location: DENVER, CO, Sponsors: SPIE
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0033326389
Wos: WOS:000083742300011
Source Identifiers
ISSN: 0277-786X
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