Photothermal and Photoconductive Determination of Surface and Bulk Defect Densities in Amorphous Silicon Films

AuthID
P-00F-R9R
8
Author(s)
Smith, ZE
·
Shepard, K
·
Aljishi, S
·
Kolodzey, J
·
Wagner, S
·
Chu, TL
Document Type
Article
Year published
1987
Published
in Applied Physics Letters, ISSN: 0003-6951
Volume: 50, Issue: 21, Pages: 1521-1523
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Publication Identifiers
SCOPUS: 2-s2.0-21544433868
Source Identifiers
ISSN: 0003-6951
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