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Surface Analysis of the Nanostructured W-Ti Thin Film Deposited on Silicon
AuthID
P-00F-SXK
8
Author(s)
Petrovic, S
·
Bundaleski, N
·
Perusko, D
·
Radovic, M
·
Kovac, J
·
Mitric, M
·
Gakovic, B
·
Rakocevic, Z
Document Type
Article
Year published
2007
Published
in
Applied Surface Science,
ISSN: 0169-4332
Volume: 253, Issue: 12, Pages: 5196-5202
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Publication Identifiers
DOI
:
10.1016/j.apsusc.2006.10.077
Scopus
: 2-s2.0-33847756724
Source Identifiers
ISSN
: 0169-4332
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