The Effects of Dielectric Loss and Tip Resistance on Resonator Q of the Scanning Evanescent Microwave Microscopy (Semm) Probe

AuthID
 P-00F-VK8
3
Author(s)
Kimber, DP
·
Alford, NM
Document Type
Article
Year published
2008
Published
in Measurement Science and Technology, ISSN: 0957-0233
Volume: 19, Issue: 11, Pages: 115502
Indexing
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-58149308624
Source Identifiers
ISSN: 0957-0233
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

footer slogan

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service