Performance, Reliability, Radiation Effects, and Aging Issues in Microelectronics - From Atomic-Scale Physics to Engineering-Level Modeling

AuthID
 P-00F-WFY
11
Author(s)
Pantelides, ST
·
Tsetseris, L
·
Beck, MJ
·
Rashkeev, SN
·
Hadjisavvas, G
·
Batyrev, IG
·
Tuttle, BR
·
Zhou, XJ
·
Fleetwood, DM
·
Schrimpf, RD
Document Type
Proceedings Paper
Year published
2010
Published
in Solid-State Electronics, ISSN: 0038-1101
Volume: 54, Issue: 9, Pages: 841-848
Indexing
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-77954218607
Source Identifiers
ISSN: 0038-1101
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

footer slogan

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service