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Microstructure Evolution During Ni/Al Multilayer Reactions
AuthID
P-00H-0RQ
5
Author(s)
Simões, S
·
Viana, F
·
Ramos, AS
·
Vieira, MT
·
Vieira, MF
Document Type
Book Chapter
Year published
2008
Published
in
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
Pages: 487-488
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DOI
:
10.1007/978-3-540-85226-1_244
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