Xafs and Xps Analysis of Zn0.98Fe0.02Te0.91Se0.09 Semiconductor

AuthID
P-00H-AV6
8
Author(s)
Radisavljević, I
·
Trigueiro, J
·
Medić, M
·
Romčević, N
·
Teodoro, O
·
Mitrić, M
·
Ivanović, N
Document Type
Article
Year published
2015
Published
in Journal of Alloys and Compounds, ISSN: 0925-8388
Volume: 632, Pages: 17-22
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ISSN: 0925-8388
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