Aluminium Incorporation in Alxga1−Xn/Gan Heterostructures: A Comparative Study by Ion Beam Analysis and X-Ray Diffraction

AuthID
 P-00H-EGE
7
Author(s)
Gago, R
·
Kreissig, U
·
di Forte Poisson, M
·
Braña, A
·
Muñoz, E
Document Type
Article
Year published
2008
Published
in Thin Solid Films, ISSN: 0040-6090
Volume: 516, Issue: 23, Pages: 8447-8452
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Source Identifiers
ISSN: 0040-6090
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