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Muon Diffusion and Trapping in Chalcopyrite Semiconductors
AuthID
P-00H-G5F
8
Author(s)
Vilão, R
·
Gil, J
·
Alberto, H
·
Duarte, J
·
Campos, Nd
·
Weidinger, A
·
Yakushev, M
·
Cox, S
Document Type
Article
Year published
2003
Published
in
Physica B: Condensed Matter,
ISSN: 0921-4526
Volume: 326, Issue: 1-4, Pages: 181-184
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DOI
:
10.1016/s0921-4526(02)01598-3
Source Identifiers
ISSN
: 0921-4526
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