X-Ray Characterization and Domain Structure of High-Quality Srbi 2 Ta 2 O 9 Single-Crystals Grown by Self-Flux Solution Method

AuthID
 P-00H-NHC
5
Author(s)
Document Type
Article
Year published
2004
Published
in Integrated Ferroelectrics, ISSN: 1058-4587
Volume: 68, Issue: 1, Pages: 259-268
Indexing
Crossref®1
Google Scholar®
Publication Identifiers
Source Identifiers
ISSN: 1058-4587
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service