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Bayesian Model Fusion: Enabling Test Cost Reduction of Analog/Rf Circuits via Wafer-Level Spatial Variation Modeling

AuthID
P-00J-XN4

Author(s)

Zhang, SH

Butler, KM

Document Type

Proceedings Paper

Year published

2014

Published

in 2014 IEEE INTERNATIONAL TEST CONFERENCE (ITC) in International Test Conference Proceedings, ISSN: 1089-3539

Volume: 2015-February

Conference

45Th Ieee International Test Conference (Itc), Date: OCT 21-23, 2014, Location: Seattle, DC, Sponsors: IEEE Comp Soc, Test Technol Tech Council, IEEE, IEEE Philadelphia Sect

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Publication Identifiers

DOI: 10.1109/test.2014.7035328

Scopus: 2-s2.0-84954288409

Wos: WOS:000370703300053

Source Identifiers

ISSN: 1089-3539

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