Identifying the Influence of the Intrinsic Defects in Gd-Doped Zno Thin-Films

AuthID
P-00K-7SK
7
Author(s)
Flemban, TH
·
Sequeira, MC
·
Zhang, Z
·
Venkatesh, S
·
Roqan, IS
Document Type
Article
Year published
2016
Published
in JOURNAL OF APPLIED PHYSICS, ISSN: 0021-8979
Volume: 119, Issue: 6, Pages: 065301 (7)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-84959450178
Wos: WOS:000370974200030
Source Identifiers
ISSN: 0021-8979
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