Quantitative X-Ray Diffraction Analysis of Bimodal Damage Distributions in Tm Implanted Al0.15Ga0.85N

AuthID
 P-00K-BYA
5
Author(s)
Fialho, M
·
Document Type
Article
Year published
2016
Published
in Journal of Physics D: Applied Physics, ISSN: 0022-3727
Volume: 49, Issue: 13
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Publication Identifiers
SCOPUS: 2-s2.0-84962438835
Source Identifiers
ISSN: 0022-3727
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