Event Life Time in Detection of Sequences of Events

AuthID
 P-00K-MF4
3
Author(s)
Document Type
Proceedings Paper
Year published
2015
Published
in 2015 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL TECHNOLOGY (ICIT)
Pages: 3144-3149 (6)
Conference
Ieee International Conference on Industrial Technology (Icit), Date: MAR 17-19, 2015, Location: Seville, SPAIN, Sponsors: IEEE
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Wos®
Publication Identifiers
Wos: WOS:000377572202155
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