Svm Classification of Thickness and Lift-Off Using Transient Eddy Current Oscillation Method

AuthID
 P-00K-PY6
4
Author(s)
Angani, CS
·
Document Type
Proceedings Paper
Year published
2016
Published
in Conference Record - IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Volume: 2016-July
Conference
2016 Ieee International Instrumentation and Measurement Technology Conference, I2Mtc 2016, Date: 23 May 2016 through 26 May 2016, Sponsors: IEEE;IEEE Instrumentation and Measurement Society
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Publication Identifiers
SCOPUS: 2-s2.0-84980347990
Source Identifiers
ISSN: 1091-5281
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