Hall Effect Measurements of Hole Mobility in an Inversion Layer at the SiSio2 Interface

AuthID
 P-00K-TH0
2
Author(s)
Pfister, JC
Document Type
Article
Year published
1971
Published
in physica status solidi (a), ISSN: 0031-8965
Volume: 5, Issue: 1, Pages: 209-218
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Publication Identifiers
Scopus: 2-s2.0-84983861135
Source Identifiers
ISSN: 0031-8965
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