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An in Situ Atomic Force Microscope for Normal-Incidence Nanofocus X-Ray Experiments
AuthID
P-00K-V7T
11
Author(s)
Vitorino, MV
·
Fuchs, Y
·
Dane, T
·
Rodrigues, MS
·
Rosenthal, M
·
Panzarella, A
·
Bernard, P
·
Hignette, O
·
Dupuy, L
·
Burghammer, M
·
Costa, L
Document Type
Article
Year published
2016
Published
in
JOURNAL OF SYNCHROTRON RADIATION,
ISSN: 1600-5775
Volume: 23, Issue: 5, Pages: 1110-1117 (8)
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Metadata
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Publication Identifiers
DOI
:
10.1107/s1600577516011437
Scopus
: 2-s2.0-84984865418
Wos
: WOS:000382299500009
Source Identifiers
ISSN
: 1600-5775
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