In Situ Tem Measurements of Nanotube and Nanosheet Properties

AuthID
P-00M-CYD
11
Author(s)
Tang, D
·
Ren, C
·
Wei, X
·
Yamaguchi, M
·
Kawamoto, N
·
Mitome, M
·
Zhi, C
·
Liu, C
·
Bando, Y
Document Type
Article
Year published
2012
Published
in Microscopy and Microanalysis, ISSN: 1431-9276
Volume: 18, Issue: S2, Pages: 1542-1543
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Publication Identifiers
Scopus: 2-s2.0-85009569558
Source Identifiers
ISSN: 1431-9276
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