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In Situ Tem Measurements of Nanotube and Nanosheet Properties
AuthID
P-00M-CYD
11
Author(s)
Golberg, D
·
Costa, PJ
·
Tang, D
·
Ren, C
·
Wei, X
·
Yamaguchi, M
·
Kawamoto, N
·
Mitome, M
·
Zhi, C
·
Liu, C
·
Bando, Y
Document Type
Article
Year published
2012
Published
in
Microscopy and Microanalysis,
ISSN: 1431-9276
Volume: 18, Issue: S2, Pages: 1542-1543
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Publication Identifiers
DOI
:
10.1017/s1431927612009567
Scopus
: 2-s2.0-85009569558
Source Identifiers
ISSN
: 1431-9276
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