Inspection of Cracks in Aluminum Multilayer Structures Using Planar Ect Probe and Inversion Problem

AuthID
 P-00M-QN5
4
Author(s)
Pasadas, DJ
·
Rocha, TJ
Document Type
Article
Year published
2017
Published
in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, ISSN: 0018-9456
Volume: 66, Issue: 5, Pages: 920-927 (8)
Conference
Ieee International Instrumentation and Measurement Technology Conference (I2Mtc), Date: MAY 23-26, 2016, Location: Taipei, TAIWAN, Sponsors: IEEE, IEEE Instrumentat & Measurement Soc, NAR Labs, Instrument Technol Res Ctr, TRIOPTICS Taiwan, HsintekOptics, BASO Precis Opt Ltd, Ind Technol Res Inst, YINSH, T & U, Lumos Technol Co Ltd, Zimmerman Sci Co Ltd, CMOS Sensor Inc, arn, Keysight Technologies, Zurich Instruments, Samwell Testing Inc
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Scopus®
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Publication Identifiers
SCOPUS: 2-s2.0-85018593865
Wos: WOS:000399246000008
Source Identifiers
ISSN: 0018-9456
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