A Test-Suite Diagnosability Metric for Spectrum-Based Fault Localization Approaches

AuthID
 P-00M-T5M
3
Author(s)
van Deursen, A
3
Editor(s)
Uchitel,S;Orso,A;Robillard,MP
Document Type
Proceedings Paper
Year published
2017
Published
in 2017 IEEE/ACM 39TH INTERNATIONAL CONFERENCE ON SOFTWARE ENGINEERING (ICSE) in International Conference on Software Engineering, ISSN: 0270-5257
Pages: 654-664 (11)
Conference
39Th Ieee/Acm International Conference on Software Engineering (Icse), Date: MAY 20-28, 2017, Location: Buenos Aires, ARGENTINA, Sponsors: IEEE, Assoc Comp Machinery, IEEE Comp Soc, IEEE Tech Council Software Engn, Special Interest Grp Software Engn, EXACTAS UBA 150, Sociedad Argentina Informatica, SADOSKY FUNDAC
Indexing
Wos®
Scopus®
Dblp®/en/publications/view/682164
Crossref®35
Google Scholar®
Publication Identifiers
Dblp: conf/icse/PerezAD17
Scopus: 2-s2.0-85020739000
Wos: WOS:000427091300058
Source Identifiers
ISSN: 0270-5257
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