A Methodological Framework Using Statistical Tests for Comparing Machine Learning Based Models Applied to Fault Diagnosis in Rotating Machinery

AuthID
P-00M-VRB
5
Author(s)
Cerrada, M
·
Sanchez, RV
·
2
Editor(s)
Rodriguez, C; Gomez, JB
Document Type
Proceedings Paper
Year published
2016
Published
in 2016 IEEE LATIN AMERICAN CONFERENCE ON COMPUTATIONAL INTELLIGENCE (LA-CCI)
Conference
3Rd Ieee Latin American Conference on Computational Intelligence (La-Cci), Date: NOV 02-04, 2016, Location: Cartagena, COLOMBIA, Sponsors: IEEE, Inst Elect & Elect Engineers Colombia Sect, IEEE Computat Intelligence Soc
Indexing
Publication Identifiers
Wos: WOS:000402174700021
Export Publication Metadata
Marked List
Info
At this moment we don't have any links to full text documens.