Prevalence of Single-Fault Fixes and Its Impact on Fault Localization

AuthID
P-00M-W6C
3
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Document Type
Proceedings Paper
Year published
2017
Published
in 2017 IEEE International Conference on Software Testing, Verification and Validation, ICST 2017, Tokyo, Japan, March 13-17, 2017 in ICST
Pages: 12-22
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DBLP: conf/icst/PerezAd17
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