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Prevalence of Single-Fault Fixes and Its Impact on Fault Localization
AuthID
P-00M-W6C
3
Author(s)
Perez, A
·
Abreu, R
·
d'Amorim, M
Document Type
Proceedings Paper
Year published
2017
Published
in
2017 IEEE International Conference on Software Testing, Verification and Validation, ICST 2017, Tokyo, Japan, March 13-17, 2017
in
ICST
Pages: 12-22
Indexing
Dblp
®
/en/publications/view/684236
Crossref
®
17
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1109/icst.2017.9
DBLP
: conf/icst/PerezAd17
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