Off-Axis Electron Holography of Unbiased and Reverse-Biased Focused Ion Beam Milled Si P-N Junctions

AuthID
 P-00N-H50
5
Author(s)
Broom, RF
·
Midgley, PA
Document Type
Article
Year published
2005
Published
in Microscopy and Microanalysis, ISSN: 1431-9276
Volume: 11, Issue: 01, Pages: 66-78
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ISSN: 1431-9276
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