Role of the Electrode Material on the Reset Limitation in Oxide Reram Devices

AuthID
 P-00N-KPE
6
Author(s)
Schoenhals, A
·
Hoffmann Eifert, S
·
Waser, R
·
Menzel, S
·
Wouters, DJ
Document Type
Article
Year published
2018
Published
in ADVANCED ELECTRONIC MATERIALS, ISSN: 2199-160X
Volume: 4, Issue: 2
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Publication Identifiers
Wos: WOS:000424888600002
Source Identifiers
ISSN: 2199-160X
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