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Experimental Characterization of Megavoltage Beams for Orthogonal Ray Imaging

AuthID
P-00N-M72

Author(s)

Travassos, C

Simoes, H

Crespo, P

Barros, MA

Lencart, J

Rachinhas, PJBM

Santos, JAM

Document Type

Proceedings Paper

Year published

2017

Published

in 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016

Volume: 2017-January

Conference

2016 Ieee Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, Nss/Mic/Rtsd 2016, Date: 29 October 2016 through 6 November 2016

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Publication Identifiers

DOI: 10.1109/nssmic.2016.8069472

SCOPUS: 2-s2.0-85041508947

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Experimental Characterization of Megavoltage Beams for Orthogonal Ray Imaging

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