Publications

Detection of Ijtag Attacks Using Ldpc-Based Feature Reduction and Machine Learning

AuthID
P-00N-ZX5

Author(s)

Ren, XL

Blanton, RDS

Tavares, VG

Document Type

Proceedings Paper

Year published

2018

Published

in 2018 23RD IEEE EUROPEAN TEST SYMPOSIUM (ETS) in Proceedings of the European Test Symposium, ISSN: 1530-1877

Volume: 2018-May, Pages: 1-6 (6)

Conference

23Rd Ieee European Test Symposium (Ets), Date: MAY 28-JUN 01, 2018, Location: Bremen, GERMANY, Sponsors: IEEE, Univ Bremen, German Res Ctr Artificial Intelligence, IEEE Council Elect Design Automat, Advantest, ARM, Bosch, Cadence, Infineon, Intel, Mentor, Qualcomm, Ridgetop Europe nv, TTTC, DFG

Indexing