Time-Of-Flight Secondary Ion Mass Spectrometry Study on Be/Al-Based Multilayer Interferential Structures

AuthID
P-00P-18R
11
Author(s)
Drozdov, MN
·
Drozdov, YN
·
Chkhalo, NI
·
Polkovnikov, VN
·
Yunin, PA
·
Chirkin, MV
·
Gololobov, GP
·
Suvorov, DV
·
Fu, DJ
·
Pelenovich, V
·
Document Type
Article
Year published
2018
Published
in THIN SOLID FILMS, ISSN: 0040-6090
Volume: 661, Pages: 65-70 (6)
Indexing
Publication Identifiers
Scopus: 2-s2.0-85050115882
Wos: WOS:000440074500010
Source Identifiers
ISSN: 0040-6090
Export Publication Metadata
Marked List
Info
At this moment we don't have any links to full text documens.