Publications

Uniaxial-Stress And Zeeman Measurements On The 943 Mev Luminescence Band In Silicon

AuthID
P-00P-3FY

Author(s)

CARMO, MC

MCGUIGAN, KG

HENRY, MO

DAVIES, G

LIGHTOWLERS, EC

Editor(s)

Wolford, DJ; Bernhols, J; Haller, EE

Document Type

Proceedings Paper

Year published

1990

Published

in IMPURITIES, DEFECTS AND DIFFUSION IN SEMICONDUCTORS : BULK AND LAYERED STRUCTURES in Materials Research Society Symposium Proceedings, ISSN: 0272-9172

Volume: 163, Pages: 273-276 (4)

Conference

Symp At The 1989 Fall Meeting Of The Materials Research Soc : Impurities,Defects, And Diffusion In Semiconductors : Bulk And Layered Structures, Date: NOV 27-DEC 01, 1989, Location: BOSTON, MA, Sponsors: MAT RES SOC, USAF, OFF SCI RES, USN, OFF NAVAL RES, IBM, LAWRENCE BERKELEY LAB, N CAROLINA STATE UNIV

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