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A Microspectroscopic Study of Cap Damage in Annealed Re-Doped Aln-Capped
AuthID
P-00P-3JR
9
Author(s)
Nogales, E
·
Lorenz, K
·
Wang, K
·
Roqan, IS
·
Martin, RW
·
O'Donnell, KP
·
Alves, E
·
Ruffenach, S
·
Briot, O
4
Editor(s)
Kuball, M; Myers, TH; Redwing, JM; Mukai, T
Document Type
Proceedings Paper
Year published
2006
Published
in
GAN, AIN, INN AND RELATED MATERIALS
in
Materials Research Society Symposium Proceedings,
ISSN: 0272-9172
Volume: 892, Pages: 625-+ (2)
Conference
Symposium on Gan, Ain, Inn Related Materials Held at the 2005 Mrs Fall Meeting,
Date:
NOV 28-DEC 02, 2005,
Location:
Boston, MA
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Wos
: WOS:000237224500093
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ISSN
: 0272-9172
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