Analysis of the Conditions for Worst Case Switching Activity in Integrated Circuits

AuthID
P-00P-54N
3
Author(s)
Document Type
Proceedings Paper
Year published
2010
Published
in 2010 FIRST IEEE LATIN AMERICAN SYMPOSIUM ON CIRCUITS AND SYSTEMS (LASCAS) in IEEE Latin American Symposium on Circuits and Systems, ISSN: 2330-9954
Pages: 117-120 (4)
Conference
1St Ieee Latin American Symposium on Circuits and Systems (Lascas), Date: FEB 24-26, 2010, Location: BAHAMAS, Sponsors: IEEE, IEEE Circuits & Syst Soc, SBC, SBM, UFRGS
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Wos: WOS:000392285500030
Source Identifiers
ISSN: 2330-9954
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