Publications

Fast Statistical Analysis of Rc Nets Subject to Manufacturing Variabilities

AuthID
P-00P-6KC

Author(s)

Bi, Y

van der Kolk, KJ

Villena, JF

Silveira, LM

van der Meijs, N

Document Type

Proceedings Paper

Year published

2011

Published

in 2011 DESIGN, AUTOMATION & TEST IN EUROPE (DATE) in Design Automation and Test in Europe Conference and Exhibition, ISSN: 1530-1591

Pages: 32-37 (6)

Conference

Design, Automation and Test in Europe Conference (Date), Date: MAR 14-18, 2011, Location: Grenoble, FRANCE, Sponsors: European Design & Automat Assoc, EDA Consortium, IEEE Council EDA, ECSI, ACM SIGDA, ACM SIGBED, IEEE Solid State Circuits Soc, IEEE Comp Soc, IFIP, Inst Engn Technol, RAS

Indexing