Scatter Fraction, Count Rates, and Noise Equivalent Count Rate of an Rpc Tof- Pet System: Simulation Study Following the Nema Nu2-2001 Standards

AuthID
P-00P-73H
1
Editor(s)
Yu, B
Document Type
Proceedings Paper
Year published
2012
Published
in 2012 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE RECORD (NSS/MIC) in IEEE Nuclear Science Symposium Conference Record, ISSN: 1082-3654
Pages: 2651-2660 (10)
Conference
Ieee Nuclear Science Symposium / Medical Imaging Conference Record (Nss/Mic) / 19Th Room-Temperature Semiconductor X-Ray and Gamma-Ray Detector Workshop, Date: OCT 29-NOV 03, 2012, Location: Anaheim, CA, Sponsors: IEEE, IEEE Nucl & Plasma Sci Soc
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Wos: WOS:000326814202164
Source Identifiers
ISSN: 1082-3654
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