Efficiency Degradation in Wideband Power Amplifiers

AuthID
 P-00P-M11
4
Author(s)
Nunes, LC
·
Barros, DR
·
Document Type
Proceedings Paper
Year published
2018
Published
in 2018 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM - IMS in IEEE MTT-S International Microwave Symposium, ISSN: 0149-645X
Volume: 2018-June, Pages: 636-639 (4)
Conference
Ieee/Mtt-S International Microwave Symposium, Date: JUN 10-15, 2018, Location: Philadelphia, PA, Sponsors: IEEE, MTT-S, RFIC, ARFTG, IMBIoC, IMS
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Publication Identifiers
Scopus: 2-s2.0-85053058161
Wos: WOS:000451173600168
Source Identifiers
ISSN: 0149-645X
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