In Situ Infrared Characterisation of the Interfacial Oxide During the Anodic Dissolution of a Silicon Electrode in Fluoride Electrolytes

AuthID
 P-00P-WGV
3
Author(s)
Ozanam, F
·
Chazalviel, JN
Document Type
Article
Year published
1996
Published
in Surface Science, ISSN: 0039-6028
Volume: 365, Issue: 1, Pages: 1-14
Indexing
Scopus®
Crossref®87
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-0030242628
Source Identifiers
ISSN: 0039-6028
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service